Assessing fault model and test quality /
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic,
[1992]
|
| Series: | Kluwer international series in engineering and computer science ;
SECS 157. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing. |
| Subjects: |
| Physical Description: | xviii, 132 pages : illustrations ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references (pages [109]-125) and index. |
| ISBN: | 0792392221 (acid-free paper) |