Assessing fault model and test quality /

Bibliographic Details
Main Author:	Butler, Kenneth M., 1962-
Other Authors:	Mercer, Melvin Ray
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic, [1992]
Series:	Kluwer international series in engineering and computer science ; SECS 157. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Digital integrated circuits > Testing. Fault-tolerant computing.

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