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IEEE International Reliability Physics Symposium proceedings /

Bibliographic Details
Previous Title:IEEE international reliability physics proceedings
Corporate Authors: International Reliability Physics Symposium, IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding
Language:English
Published: Piscataway, N.J. : The Societies, [1997-]
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.
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Description
Published:35th (1997)-
Physical Description:volumes : illustrations ; 28 cm.
Also available by subscription, in PDF format, via the World Wide Web.
Publication Frequency:Annual
ISSN:1541-7026
1938-1891
1082-7285