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IEEE International Reliability Physics Symposium proceedings /

Bibliographic Details
Previous Title:IEEE international reliability physics proceedings
Corporate Authors: International Reliability Physics Symposium, IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding
Language:English
Published: Piscataway, N.J. : The Societies, [1997-]
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.
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Holdings details from Remote Storage
Call Number: TK7870 .S98
Notes: Subscription converted to electronic format.
Library Owns: TK7870 .S98 (35th-41st (1997-2003))
Call Number Status Get It
TK7870 .S98 35th 1997 Available
TK7870 .S98 36th 1998 Available
TK7870 .S98 37th 1999 Available
TK7870 .S98 38th 2000 Available
TK7870 .S98 39th 2001 Available
TK7870 .S98 40th 2002 Available
TK7870 .S98 41st 2003 Available