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Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy /

Bibliographic Details
Main Author: Eberhart, J. P. (Jean Pierre)
Format: Book
Language:English
Published: Chichester, West Sussex, England ; New York : Wiley, [1991]
Subjects:
Materials > Microscopy.
Microstructure.
Description
Physical Description:xxx, 545 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references (pages [533]-538) and index.
ISBN:0471929778 :