Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy /

Bibliographic Details
Main Author:	Eberhart, J. P. (Jean Pierre)
Format:	Book
Language:	English
Published:	Chichester, West Sussex, England ; New York : Wiley, [1991]
Subjects:	Materials > Microscopy. Microstructure.

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