Cover Image

Selected papers on speckle metrology /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Sirohi, R. S.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE Optical Engineering Press, [1991]
Series:SPIE milestone series ; v. MS 35.
Subjects:
Speckle metrology.
Holographic interferometry.
Description
Item Description:"A publication of SPIE--the International Society for Optical Engineering."
Physical Description:xviii, 668 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0819406384 (hardbound)
0819406392 (softbound)