Selected papers on speckle metrology /

Bibliographic Details

Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Sirohi, R. S.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE Optical Engineering Press, [1991]
Series:	SPIE milestone series ; v. MS 35.
Subjects:	Speckle metrology. Holographic interferometry.