Characterization of advanced materials /

Bibliographic Details
Corporate Authors: Symposium on the Characterization of Advanced Materials, International Metallography Society
Other Authors: Altergott, William, Henneke, Edmund G.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1990]
Subjects:
Description
Item Description:Papers from the Symposium on the Characterization of Advanced Materials, sponsored by the International Metallography Society and held in Monterey, Calif., Jul. 27-30, 1987.
Physical Description:ix, 183 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306438372