Characterization of advanced materials /

Bibliographic Details
Corporate Authors: Symposium on the Characterization of Advanced Materials, International Metallography Society
Other Authors: Altergott, William, Henneke, Edmund G.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1990]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TA418.2 .C46 1990
 
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TA418.2 .C46 1990 Available