Cover Image

X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Federal Aviation Administration Technical Center (U.S.). Aviation Security Research & Development Service
Other Authors: Mills, Dennis M.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1550.
Subjects:
Nondestructive testing > Congresses.
X-ray spectroscopy > Congresses.
Materials > Testing > Congresses.
Description
Physical Description:172 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819406783