X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Federal Aviation Administration Technical Center (U.S.). Aviation Security Research & Development Service
Other Authors:	Mills, Dennis M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1550.
Subjects:	Nondestructive testing > Congresses. X-ray spectroscopy > Congresses. Materials > Testing > Congresses.

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