Cover Image

Digital systems testing and testable design /

Show other versions (1)
Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A., Friedman, Arthur D.
Format: Book
Language:English
Published: New York, NY : Computer Science Press, [1990]
Series:Electrical engineering communications and signal processing series.
Subjects:
Digital integrated circuits > Testing.
Digital integrated circuits > Design and construction.
Electronic equipment > Testing
Search Result 1
Cover Image
by Abramovici, Miron
Published 1990
Book
Show all versions (2)