Digital systems testing and testable design /

Bibliographic Details
Main Author:	Abramovici, Miron
Other Authors:	Breuer, Melvin A., Friedman, Arthur D.
Format:	Book
Language:	English
Published:	New York, NY : Computer Science Press, [1990]
Series:	Electrical engineering communications and signal processing series.
Subjects:	Digital integrated circuits > Testing. Digital integrated circuits > Design and construction. Electronic equipment > Testing

Evans: Library Stacks