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Digital systems testing and testable design /

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Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A., Friedman, Arthur D.
Format: Book
Language:English
Published: New York, NY : Computer Science Press, [1990]
Series:Electrical engineering communications and signal processing series.
Subjects:
Digital integrated circuits > Testing.
Digital integrated circuits > Design and construction.
Electronic equipment > Testing
Description
Physical Description:xxi, 653 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 644-645) and index.
ISBN:0716781794 :