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Neural models and algorithms for digital testing /

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Bibliographic Details
Main Author: Chakradhar, Srimat T.
Other Authors: Agrawal, Vishwani D., 1943-, Bushnell, Michael L. (Michael Lee), 1950-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1991]
Series:Kluwer international series in engineering and computer science ; SECS 140.
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:
Logic circuits > Testing.
Automatic test equipment.
Digital integrated circuits > Testing > Data processing.
Description
Physical Description:xii, 184 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792391659 (acid-free paper)