Neural models and algorithms for digital testing /

Bibliographic Details
Main Author:	Chakradhar, Srimat T.
Other Authors:	Agrawal, Vishwani D., 1943-, Bushnell, Michael L. (Michael Lee), 1950-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1991]
Series:	Kluwer international series in engineering and computer science ; SECS 140. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Logic circuits > Testing. Automatic test equipment. Digital integrated circuits > Testing > Data processing.

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