Cover Image

Particle beam microanalysis : fundalmentals methods and applications /

Bibliographic Details
Main Author: Fuchs, Ekkehard
Other Authors: Oppolzer, Helmut, Rehme, Hans
Format: Book
Language:English
Published: Weinheim, F.R.G. ; New York, NY, USA : VCH, [1990]
Subjects:
Materials > Microscopy.
Electron microscopy > Industrial applications.
Description
Physical Description:507 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:3527268847 (VCH, Weinheim : alk. paper)
0895735059 (VCH, New York : alk. paper)