Particle beam microanalysis : fundalmentals methods and applications /

Bibliographic Details
Main Author:	Fuchs, Ekkehard
Other Authors:	Oppolzer, Helmut, Rehme, Hans
Format:	Book
Language:	English
Published:	Weinheim, F.R.G. ; New York, NY, USA : VCH, [1990]
Subjects:	Materials > Microscopy. Electron microscopy > Industrial applications.

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