International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 : [proceedings] /

Bibliographic Details
Corporate Author:	International Symposium on Electron Microscopy Beijing, China
Other Authors:	Guo, Kexin, Yao, Jun'en
Format:	Conference Proceeding Book
Language:	English
Published:	Singapore ; New Jersey : World Scientific, [1991]
Subjects:	Electron microscopy > Congresses. Electron microscopy > Technique > Congresses. Electron microscopy > China > Congresses.

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