Diagnostic measurements in LSI/VLSI integrated circuits production /

Bibliographic Details
Main Author: Jakubowski, Andrzej
Other Authors: Marciniak, Wiesław, Przewłocki, Henryk M.
Format: Book
Language:English
Published: Singapore ; Teaneck, NJ : World Scientific, [1991]
Series:Advanced series in electrical and computer engineering ; vol. 7.
Subjects:

MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a22000008a 4500
001 in00001021069
005 20150928122242.0
008 910410s1991 si 000 0 eng
010 |a  91003700  
020 |a 9810202822 
035 |a (OCoLC)23692863 
035 |9 AFG2370AM 
040 |a DLC  |c DLC  |d TXA  |d UtOrBLW 
049 |a TXAM 
050 0 0 |a TK7874  |b .J34 1991 
082 0 0 |a 621.39/5  |2 20 
100 1 |a Jakubowski, Andrzej. 
245 1 0 |a Diagnostic measurements in LSI/VLSI integrated circuits production /  |c Andrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki. 
263 |a 9104 
264 1 |a Singapore ;  |a Teaneck, NJ :  |b World Scientific,  |c [1991] 
264 4 |c ©1991 
300 |a 356 pages :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a Advanced series in electrical and computer engineering ;  |v vol. 7 
504 |a Includes bibliographical references. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design and construction. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing. 
700 1 |a Marciniak, Wiesław. 
700 1 |a Przewłocki, Henryk M. 
830 0 |a Advanced series in electrical and computer engineering ;  |v vol. 7. 
999 |a MARS 
999 f f |s 72573633-f71f-346e-bb82-1d3a2f498049  |i 97829004-b264-338a-a961-45ada3694bf9  |t 0 
952 f f |p ric  |a Texas A&M University  |b Rellis Campus  |c Joint Library Facility  |d Remote Storage  |t 0  |e TK7874 .J34 1991  |h Library of Congress classification  |i unmediated -- volume  |m A14815286901 
998 f f |a TK7874 .J34 1991  |t 0  |l Remote Storage