Diagnostic measurements in LSI/VLSI integrated circuits production /

Bibliographic Details
Main Author:	Jakubowski, Andrzej
Other Authors:	Marciniak, Wiesław, Przewłocki, Henryk M.
Format:	Book
Language:	English
Published:	Singapore ; Teaneck, NJ : World Scientific, [1991]
Series:	Advanced series in electrical and computer engineering ; vol. 7.
Subjects:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.

Remote Storage