Cover Image

Diagnostic measurements in LSI/VLSI integrated circuits production /

Bibliographic Details
Main Author: Jakubowski, Andrzej
Other Authors: Marciniak, Wiesław, Przewłocki, Henryk M.
Format: Book
Language:English
Published: Singapore ; Teaneck, NJ : World Scientific, [1991]
Series:Advanced series in electrical and computer engineering ; vol. 7.
Subjects:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.
Description
Physical Description:356 pages : illustrations
Bibliography:Includes bibliographical references.
ISBN:9810202822