High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Symposium on Advances in Intelligent Systems
Other Authors:	Chen, Michael J. W.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1991]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1384.
Subjects:	Engineering inspection > Automation > Congresses. Quality control > Optical methods > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1384.toc

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