Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1990]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1332. |
| Subjects: |
| Item Description: | "Conference 1332,... was part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California."--P. x. |
|---|---|
| Physical Description: | 2 volumes (xii, 886 pages) : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819403938 |