Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, International Symposium on Optical & Optoelectronic Applied Science & Engineering
Other Authors:	Grover, C. P.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1990]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1332.
Subjects:	Measurement > Congresses. Optical measurements > Congresses.

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