Rapid thermal and related processing techniques : 2-3 October 1990, Santa Clara, California /

Advanced techniques for integrated circuit processing II : 21-23 September 1992, San Jose, California /
Published: (1993)

Digest of technical papers : November 9-12, 1987, Convention Center, Santa Clara, California /
Published: (1987)

Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003, Santa Clara, California, USA /
Published: (2003)

Advanced techniques for integrated circuit processing : 1-5 October 1990, Santa Clara, California /
Published: (1991)

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
Published: (2001)

Digest of technical papers : IEEE International Conference on Computer-Aided Design, ICCAD-89, a conference for the EE CAD professional, November 5-9, 1989, Convention Center, Santa Clara, California /
Published: (1989)

2001 proceedings : Sixth International Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference (CMP-MIC) : March 7-9, 2001, Santa Clara Marriott Hotel, Santa Clara, CA : a specialty conference of Microelectronics Institute Inter on-chip Connection.
Published: (2001)

2002 proceedings : Seventh International Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference (CMP-MIC), February 27 - March 1, 2002, Santa Clara Marriott Hotel, Santa Clara, CA, a specialty conference of Microelectronics Institute Inter on-chip Connection.
Published: (2002)

Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September 1999, Santa Clara, California /
Published: (1999)

Automatic logic synthesis techniques for digital systems /
by: Edwards, Martyn D.
Published: (1992)

Design and process integration for microelectronic manufacturing II : 26-27 February 2004, Santa Clara, California, USA /
Published: (2004)

Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA /
Published: (2003)

Metrology, inspection, and process control for microlithography XIV : 28 February-2 March 2000, Santa Clara, California /
Published: (2000)

Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA /
Published: (2002)

Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, Santa Clara, California /
Published: (1998)

Metrology, inspection, and process control for microlithography XIII : 15-18 March 1999, Santa Clara, California /
Published: (1999)

Metrology, inspection, and process control for microlithography XVII : 24-27 February 2003, Santa Clara, California, USA /
Published: (2003)

Metrology, inspection, and process control for microlithography XVIII : 23-26 February 2004, Santa Clara, California, USA /
Published: (2004)

Microelectronic processes, sensors, and controls : 27-29 September 1993, Monterey, California /
Published: (1994)

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

Advanced low-power digital circuit techniques /
by: Elrabaa, Muhammad S.
Published: (1997)

Process, equipment, and materials control in integrated circuit manufacturing IV : 22-24 September 1998, Santa Clara, California /
Published: (1998)

Proceedings : 2001 HD International Conference on High-Density Interconnect and Systems Packaging : April 17-20, 2001, Santa Clara Convention Center, Santa Clara, California /
Published: (2001)

Analog circuit design : (X)DSL and other communication systems; RF MOST models; integrated filters and oscillators /
Published: (1999)

Algorithms and techniques for VLSI layout synthesis /
Published: (1989)

EDA for IC implementation, circuit design, and process technology /
Published: (2006)

Metrology, inspection, and process control for microlithography XI : 10-12 March 1997, Santa Clara, California /
Published: (1997)

Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA /
Published: (2003)

Metrology, inspection, and process control for microlithography XVI : 26 4-7 March 2002, Santa Clara, USA /
Published: (2002)

Metrology, inspection, and process control for microlithography XV : 26 February-1 March 2001, Santa Clara, USA /
Published: (2001)

In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II : 23-24 September 1998, Santa Clara, California /
Published: (1998)

High-performance VLSI signal processing : innovative architectures and algorithms /
Published: (1998)

Emerging technologies for in situ processing /
Published: (1988)

Hardware accelerators for electrical CAD : papers presented at the International Workshop on Hardware Accelerators, Oxford, 30 September-2 October, 1987 /
Published: (1988)

EDA for IC implementation, circuit design, and process technology /
Published: (2006)

Digitally-assisted analog and analog-assisted digital IC design /
Published: (2015)