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Defects in silicon : proceedings of symposium b on science and technology of defects in silicon of the 1989 E-MRS conference, Strasbourg, France, 30 May-2 June 1989 /

Bibliographic Details
Corporate Authors: Symposium B on Science and Technology of Defects in Silicon Strasbourg, France, European Materials Research Society. Meeting
Other Authors: Ammerlaan, C. A. J. (Cornelis Antonius Josephus), Chantre, A., Wagner, P.
Format: Conference Proceeding Book
Language:English
Published: Amsterdam ; New York : North-Holland, 1989.
Series:European Materials Research Society symposia proceedings ; v. 9.
Subjects:
Silicon > Defects.
Semiconductors > Defects.
Semiconductors: Silicon > Defects & impurities

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Call Number: QC611.8.S5 S95 1989
 
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QC611.8.S5 S95 1989 Available