Cover Image

Surface characterization and testing II : 10-11 August 1989, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors: Greivenkamp, John E., Young, Matt, 1941-
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1164.
Subjects:
Surfaces (Technology) > Testing > Congresses.
Surfaces (Technology) > Optical properties > Congresses.
Description
Physical Description:vi, 271 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819402001