Surface characterization and testing II : 10-11 August 1989, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors:	Greivenkamp, John E., Young, Matt, 1941-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1164.
Subjects:	Surfaces (Technology) > Testing > Congresses. Surfaces (Technology) > Optical properties > Congresses.

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