Cover Image

Atom-probe field ion microscopy and its applications /

Bibliographic Details
Main Author: Sakurai, Toshio
Other Authors: Sakai, A., Pickering, H. W.
Format: Book
Language:English
Published: Boston : Academic Press, [1989]
Series:Advances in electronics and electron physics. Supplement ; 20.
Subjects:
Atom-probe field ion microscopy.
Description
Physical Description:vii, 299 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages 275-292) and indexes.
ISBN:0120145820