Atom-probe field ion microscopy and its applications /

Bibliographic Details

Main Author:	Sakurai, Toshio
Other Authors:	Sakai, A., Pickering, H. W.
Format:	Book
Language:	English
Published:	Boston : Academic Press, [1989]
Series:	Advances in electronics and electron physics. Supplement ; 20.
Subjects:	Atom-probe field ion microscopy.