The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /

The three faces of test : design, characterization, production : proceedings /
Published: (1984)

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /
Published: (1983)

Automatic testing and evaluation of digital integrated circuits /
by: Healy, James T., 1940-
Published: (1981)

Proceedings /
Published: (1986)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

Testability concepts for digital ICs : the macro test approach /
by: Beenker, F. P. M. (Frans P. M.)
Published: (1995)

An engineer's guide to automated testing of high-speed interfaces /
by: Moreira, José, 1975-, et al.
Published: (2016)

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Published: (1986)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.
Published: (1989)

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Published: (1987)

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Published: (1985)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Proceedings of the ... International Conference on Microelectronic Test Structures /
Published: (1989)

Developments in integrated circuit testing /
Published: (1987)

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
Published: (1980)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Design-for-test for digital IC's and embedded core systems /
by: Crouch, Alfred L.
Published: (1999)

Proceedings : International Test Conference 1995.
Published: (1995)

Proceedings International Test Conference 2002 /
Published: (2002)

Proceedings, International Test Conference 1998.
Published: (1998)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Neural models and algorithms for digital testing /
by: Chakradhar, Srimat T.
Published: (1991)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Proceedings, International Test Conference, 1993.
Published: (1993)

Proceedings : International Test Conference 1996.
Published: (1996)

Introduction to digital board testing /
by: Bennetts, R. G.
Published: (1982)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

An introduction to mixed-signal IC test and measurement /
by: Burns, Mark, 1962-
Published: (2001)

IEEE VLSI Test Symposium : digest of papers.
Published: (1990)

Analog and mixed-signal test /
Published: (1998)

Testing and diagnosis of VLSI and ULSI /
Published: (1988)

Proceedings of the ... IEEE VLSI Test Symposium : VTS.