The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /

Bibliographic Details
Corporate Authors:	International Test Conference Washington, DC, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society Press, [1990]
Subjects:	Integrated circuits > Testing > Congresses. Automatic test equipment > Congresses.

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