Cover Image

The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /

Bibliographic Details
Corporate Authors: International Test Conference Washington, DC, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1990]
Subjects:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:"Computer Society Press number 2064"--Title page verso.
"IEEE catalog number 90CH2910-8"--Title page verso.
Spine title: 1990 IEEE International Test Conference.
Physical Description:xvi, 1083 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818620641 (pbk.)
081869064X (hard)
0818660643 (microfiche)