APA (7th ed.) Citation

International Test Conference Washington, DC, IEEE Computer Society. Test Technology Technical Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1990). The changing philosophy of test: International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

International Test Conference Washington, DC, IEEE Computer Society. Test Technology Technical Committee, and Institute of Electrical and Electronics Engineers. Philadelphia Section. The Changing Philosophy of Test: International Test Conference ,1990 Proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC. Los Alamitos, Calif.: IEEE Computer Society Press, 1990.

MLA (9th ed.) Citation

International Test Conference Washington, DC, et al. The Changing Philosophy of Test: International Test Conference ,1990 Proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC. IEEE Computer Society Press, 1990.