Cover Image

Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Institute of Electrical and Electronics Engineers. Philadelphia Section, IEEE Industrial Electronics Society, Carnegie-Mellon University. Center for Optical Data Processing
Other Authors: Chen, Michael J. W.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1990]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1197.
Subjects:
Computer architecture > Congresses.
Pattern recognition systems > Congresses.
Description
Item Description:Includes bibliographies and index.
Physical Description:vii, 310 pages : illustrations ; 28 cm.
ISBN:0819402362