Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Institute of Electrical and Electronics Engineers. Philadelphia Section, IEEE Industrial Electronics Society, Carnegie-Mellon University. Center for Optical Data Processing
Other Authors:	Chen, Michael J. W.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1990]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1197.
Subjects:	Computer architecture > Congresses. Pattern recognition systems > Congresses.

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