Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
[1990]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1180. |
| Subjects: |
| Item Description: | At head of title: Proceedings / SPIE--the International Society for Optical Engineering. |
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| Physical Description: | vi, 196 pages : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographies and index. |
| ISBN: | 0819402168 |