Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Wadekar, Shekhar G.
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [1990]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1180.
Subjects:	Electrooptical devices > Congresses. Electrooptics > Congresses.

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