Design & test techniques for VLSI & WSI circuits /

Bibliographic Details
Corporate Author:	Institution of Electrical Engineers
Other Authors:	Massara, R. E., 1947-
Format:	Book
Language:	English
Published:	London, U.K. : P. Peregrinus on behalf of the Institution of Electrical Engineers, [1989]
Series:	IEE computing series ; 15.
Subjects:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Wafer-scale integration > Design and construction. Integrated circuits > Wafer-scale integration > Testing. Electronic equipment > Very large scale integrated circuits > Design

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