Cover Image

Rapid reliability assessment of VLSICs /

Show other versions (1)
Bibliographic Details
Other Authors: Dorey, A. P.
Format: Book
Language:English
Published: New York : Plenum Press, [1990]
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Reliability.
Search Result 1
Cover Image
by Dorey, A. P.
Published 1990
Connect to the full text of this electronic book
eBook
Show all versions (2)