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Rapid reliability assessment of VLSICs /

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Bibliographic Details
Other Authors: Dorey, A. P.
Format: Book
Language:English
Published: New York : Plenum Press, [1990]
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Reliability.

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Call Number: TK7874 .R37 1990
 
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TK7874 .R37 1990 Available