Cover Image

Rapid reliability assessment of VLSICs /

Show other versions (1)
Bibliographic Details
Other Authors: Dorey, A. P.
Format: Book
Language:English
Published: New York : Plenum Press, [1990]
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Reliability.
Description
Physical Description:ix, 202 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:030643492X