Cover Image

X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Christensen, Finn E., 1954-
Format: Book
Language:English
Published: Bellingham, Wash., USA : The Society, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 984.
Subjects:
Thin films, Multilayered > Congresses.
X-rays > Congresses.
Monochromator > Surfaces > Congresses.
Spectrometer > Congresses.
X-ray diffractometer > Surfaces > Congresses.
Description
Physical Description:viii, 271 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:081940019X