X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Christensen, Finn E., 1954-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : The Society, [1988]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 984.
Subjects:	Thin films, Multilayered > Congresses. X-rays > Congresses. Monochromator > Surfaces > Congresses. Spectrometer > Congresses. X-ray diffractometer > Surfaces > Congresses.

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