Structural pattern analysis /

Bibliographic Details
Corporate Author:	IAPR Technical Committee on Syntactical and Structural Pattern Recognition
Other Authors:	Mohr, Roger, Pavlidis, Theodosios, Sanfeliu, Alberto
Format:	Book
Language:	English
Published:	Singapore ; New Jersey : World Scientific, 1990.
Series:	Series in computer science ; vol. 19.
Subjects:	Pattern recognition systems > Congresses.

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