Cover Image

Conference record /

Bibliographic Details
Corporate Authors: IEEE Instrumentation and Measurement Technology Conference San Jose, Calif., Institute of Electrical and Electronics Engineers
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. : Piscataway, NJ : IEEE ; Additional copies may be ordered from IEEE Service Center, ©1990.
Subjects:
Measurement > Congresses.
Mesure > Congrès.
Measurement.
Mensuration > Congresses
Conference papers and proceedings.
Online Access:IEEE Xplore
Description
Item Description:Cover title: Emerging measurement technologies.
"IEEE catalog no. 90CH2735-9."
Physical Description:xix, 383 pages : illustrations ; 28 cm
Bibliography:Includes bibliographical references.