Conference record /

Bibliographic Details
Corporate Authors:	IEEE Instrumentation and Measurement Technology Conference San Jose, Calif., Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding Book
Language:	English
Published:	New York, N.Y. : Piscataway, NJ : IEEE ; Additional copies may be ordered from IEEE Service Center, ©1990.
Subjects:	Measurement > Congresses. Mesure > Congrès. Measurement. Mensuration > Congresses Conference papers and proceedings.
Online Access:	IEEE Xplore

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