Cover Image

Reliability physics 1990 : 28th annual proceedings, New Orleans, Louisiana, March 27, 28, 29, 1990 /

Bibliographic Details
Corporate Authors: International Reliability Physics Symposium New Orleans, La., IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. (345 E. 47th St., New York 10017) : Institute of Electrical and Electronics Engineers, [1990]
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Description
Item Description:"IEEE catalog number 90CH2787-0."
Cover title: 1990 IEEE Annual International Reliability and Physics.
Physical Description:vi, 322 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.